Observations of Internal Charging Currents in Medium Earth Orbit
IEEE Transaction on Plasma Science, Vol. 36, No. 5, October 2008 (© 2008 IEEE)
+ Download | PDF | 9 Pages | 1.7MB
Radiation monitoring in Medium Earth Orbit over the solar minimum period
Proceedings of RADECE 2008, 10th-12th September 2008, Jyväskylä, Finland.
+ Download | PDF | 7 Pages | 536KB
Observation of the Solar Particle Events of October and November 2003 From CREDO and MPTB
IEEE Transactions on Nuclear Science, Vol. 51, No. 6, December 2004 (© 2004 IEEE)
+ Download | PDF | 6 Pages | 376KB
Observation of Solar Particle Events From CREDO and MPTB During the Current Solar Maximum
IEEE Transactions on Nuclear Science, Vol. 49, No. 6, December 2002 (© 2002 IEEE)
+ Downlaod | PDF | 5 Pages | 492KB
Radiation Environment Measurements from CREAM and CREDO During the Approach to Solar Maximum
IEEE Transactions on Nuclear Science, Vol. 47, No. 6, December 2000 (© 2000 British Crown Copyright)
+ Download | PDF | 10 Pages | 232KB
Simplified Readout of UVPROM Dosimeters for Spacecraft Applications
IEEE Transactions on Nuclear Science, Vol. 53, No. 4, August 2006
+ Download | PDF | 4 Pages | 284KB
Online Dosimetry Based on Optically Stimulated Luminescence Materials
IEEE Transactions on Nuclear Science, Vol. 52, No. 6, December 2005 (© 2005 IEEE)
+ Download | PDF | 5 Pages | 240KB
Energy-Deposition Events Measured by the CRRES PHA Experiment
IEEE Transactions on Nuclear Science, Vol. 51, No. 6, December 2004 (© 2004 IEEE)
+ Download | PDF | 7 Pages | 208KB
DIME-1: The Passive Components of the Dosimetry Intercomparison and Miniaturization Experiment
+ Download | PDF | 7 Pages | 220KB
Modeling the Dose Rate Response and the Effects of Hydrogen in Bipolar Technologies
IEEE Transactions on Nuclear Science, Vol. 56, No. 6, December 2009 (© 2009 IEEE)
+ Download | PDF | 7 Pages | 556KB
Mechanisms of Enhanced Radiation-Induced Degradation Due to Excess Molecular Hydrogen in Bipolar Oxides
IEEE Transaction on Nuclear Science, Vol. 54, No. 6, December 2007 (© 2007 IEEE)
+ Download | PDF | 7 Pages | 624KB
Nature of Interface Defect Buildup in Gated Bipolar Devices Under Low Dose Rate Irradiation
IEEE Transactions on Nuclear Science, Vol. 53, No. 6, December 2006 (© 2006 IEEE)
+ Download | PDF | 6 Pages | 600KB
Combining Results of Accelerated Radiation Tests and Fault Injections to Predict the Error Rate of an Application Implemented in SRAM-based FPGAs
Manuscript recieved July 13th, 2010
+ Download | PDF | 6 Pages | 252KB
